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Home | Videos

Automatic Defect Classification (ADC) Solution Using Data-Centric Artificial Intelligence

LandingAI November 11, 2023

Check out our presentation at the upcoming “Artificial Intelligence and Machine Learning for Manufacturing” virtual conference, hosted by NAFEMS. We are teaming up with NXP to discuss “Leveraging Data-Centric AI in Automatic Defect Classification (ADC) for Outgoing Quality Inspection in Semiconductors”.

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