Semiconductor and MEMS manufacturers around the world are maximizing their yield and reducing expenses through the use of AI defect detection. By leveraging computer vision for defect detection and classification, these manufacturers empower advanced technologies to elevate everyday experiences.
Watch this recorded webinar to learn how Domain-Specific Large Vision Models (LVMs) can provide a step function in semiconductor wafer fabrication, increasing time-to-value and inspection accuracy.
Hear from LandingAI’s computer vision experts Ian Rysdale and Quinn Killough as they discuss:
• Real-world cases of defect detection using AI computer vision in Semiconductor and MEMs
• How Domain-Specific Large Vision Models and AI in manufacturing can further improve inspection solutions
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