Get Started with Deep Learning in
Electronic-Devices Inspection

With trends in connected technology such as IoT and Industry 4.0, manufacturers are collecting more data than ever before. Some facilities struggle to figure out how to get the greatest ROI from the data they collect. Fortunately, connected dashboards and machine vision can turn data into usable information. For inspection applications, machine vision can validate quality-control parameters. However, defining, classifying, and labeling defects is challenging for traditional, rule-based machine-vision solutions.

Read more about deep learning in electronic-devices by downloading the Case Study