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AI Use Cases in the Semiconductor Industry
The flexible deployment options in LandingLens allow you to seamlessly integrate a LandingLens model into your quality control process.
Automatic Defect Detection (ADC)
Inline ADC
Use a model from LandingLens to catch issues at any stage of the production process. This identifies issues before more value is added to the wafer in downstream tasks, saving you time and money.
Outgoing ADC
A single model in LandingLens can be trained to identify multiple defects for different technologies. Additionally, an automated model can review 100% of your captured images at a highly accurate rate.
Automated Optical Inspection (AOI)
Train a computer vision model that can perform automatic defect classification in an Automated Optical Inspection (AOI) system.
Resources
Blog
Automatic Defect Classification in Wafer Fabrication
Case Studies
Blog
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