Improving Semiconductor Defect Detection & Classification Using Large Vision Models (LVMs)

Semiconductor and MEMS manufacturers around the world are maximizing their yield and reducing expenses through the use of AI. These manufacturers empower advanced technologies and elevate everyday experiences.

Watch this recorded webinar to learn how Domain-Specific Large Vision Models (LVMs) can provide a step function increase in the time to value and wafer inspection accuracy.

Hear from Landing AI’s computer vision experts Ian Rysdale and Quinn Killough as they discuss:

• Real-world use cases using AI in Semiconductor and MEMs
• How AI and Domain-Specific Large Vision Model can further improve inspection solution

Start using LandingLens today for free: https://app.landing.ai/signup